COMSEC presented HiFi-DRAM at the top ISCA conference in Buenos Aires. We used Scanning Electron Microscopy (SEM) with Field Ion Beam (FIB) to reverse engineer sense amplifier designs in commodity DDR4 and DDR5 chips from all major DRAM vendors. HiFi-DRAM shows that many critical assumptions made by DRAM researchers unfortunately do not hold up in practice and comes up with a number of recommendations for improving the fidelity of DRAM research in the future. HiFi-DRAM was nominated for the best paper award.